Authorized distribution • Europe-wide service

Inspection and metrology solutions for advanced manufacturing

We distribute Nanotronics’ nSpec automated optical inspection (AOI) systems and SWS‑tec’s non-contact eddy‑current measurement solutions. We provide sales, installation, training, calibration, and on‑site service throughout Europe.

Sales & integration Europe service Calibration & maintenance Application support
Nanotronics nSpec automated optical inspection system

What we deliver

Focused on uptime, yield and actionable defect intelligence

Nanotronics nSpec — automated optical inspection

nSpec combines high-quality optics, robotics, computer vision and AI to identify, classify and assign causality to defects. Configurations support both R&D and production environments.

Explore nSpec systems

SWS‑tec — non-contact resistivity & thin‑film measurement

SWS‑tec’s eddy‑current based measurement solutions enable non-contact, non-destructive sheet resistance, resistivity and thickness measurement for semiconductor and thin‑film applications.

Explore SWS‑tec systems

Service in Europe

Local support to keep your tools running

Commissioning & integration

On-site installation, configuration, and production handover — including recipes, workflows and operator training.

Maintenance & calibration

Preventive maintenance, calibration services and spare parts to minimize downtime and protect measurement integrity.

Semiconductor AOI and Metrology Expertise

Semiconductor Equipment Solutions (SES) supports semiconductor manufacturers, research institutes and advanced packaging facilities with automated optical inspection (AOI), wafer defect inspection, sheet resistance measurement, thin-film metrology and process control solutions. Our portfolio includes Nanotronics nSpec inspection systems and SWS-tec eddy-current metrology equipment for silicon wafers, compound semiconductors, MEMS, photonics and advanced materials.

European semiconductor inspection coverage

Germany, Austria, Switzerland and the wider European market

SES supports semiconductor fabs, research institutes, MEMS, photonics, compound semiconductor and advanced packaging sites across Europe. Core search and application areas include AOI systems, wafer inspection, sheet resistance measurement, thin-film metrology, defect classification, process control and service support for semiconductor equipment.

Frequently asked questions

Which AOI systems does SES support?

SES supports Nanotronics nSpec automated optical inspection systems for R&D, process development and production inspection workflows.

Do you provide semiconductor service in Europe?

Yes. SES provides installation, commissioning, training, maintenance, calibration and on-site support for customers across Europe.

What metrology applications are covered?

Key applications include sheet resistance, resistivity, thin-film thickness, eddy-current measurement, wafer inspection and defect review.